Chip Orientation Inspection
Automatically inspect each chip to identify reversed or incorrectly oriented units and clearly mark NG positions on the corresponding tray layout.
Benchtop Semiconductor Vision Inspection System
Compact in Form. Simpler by Design.
Built for tray-loaded chips, Apexera Station inspects orientation and surface markings in a single capture, with a streamlined workflow designed for easy operation.
Vision Inspection System
Apexera Station integrates industrial imaging, precision motion control and vision inspection software into one automated system for tray-loaded chips.
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Faster Inspection
Simpler Operation
Lightweight Design
Applications
Designed for tray-loaded semiconductor devices where orientation, surface markings and correct placement must be verified before the next process.
Automatically inspect each chip to identify reversed or incorrectly oriented units and clearly mark NG positions on the corresponding tray layout.
Inspect surface markings directly from captured chip images and compare them with the configured reference to identify incorrect or mismatched markings.
Why Apexera Station
Apexera Station combines consistent chip inspection with an automated, operator-friendly workflow—helping prevent orientation and marking errors from moving downstream while improving inspection efficiency.
Inspect every chip against consistent criteria to identify orientation errors, marking mismatches, and missing units before they reach the next process.
Automate repetitive inspection tasks and simplify product changeovers to keep inspection moving efficiently across different chip types.
Key Features
From setting up a new chip to locating an NG unit on the tray, Apexera Station is designed around the actual tasks operators perform on the production floor.
—— Capability 01
Orientation and marking are checked from the same captured image. Apexera Station evaluates each chip for correct placement direction while checking its marking.
—— Capability 02
Each Chip ID binds its tray, imaging range, template, and inspection settings. When an ID is selected, the complete configuration loads automatically, without separately selecting recipes or complex settings.
—— Capability 03
When a new chip type is introduced, the operator can build its inspection configuration on-site through a guided workflow. No off-site model retraining is required.
—— Capability 04
Supports 1×1, 2×1, 1×2, 2×3 and other imaging ranges to balance inspection detail and efficiency. Multiple small chips can be inspected in a single shot to significantly increase UPH.
—— Capability 05
Each digital cell corresponds to a physical tray position, so operators can locate OK, NG, and empty slots directly by row and column from the map instead of searching the tray manually.
Built for Flexibility
Adapt to different chips and inspection needs without adding complexity to daily operation.
Inspect tray-loaded chips of different sizes and shapes without retraining the model.
Bring new chip types into inspection through a simple guided setup. Match chip, tray, imaging range and template for a fast start.
Key optical and mechanical settings are handled during initial setup; only X/Y fine-tuning is needed for routine operation.
Technical Specifications
Key system, inspection, imaging, and handling specifications for evaluating fit with your chip inspection requirements.
Minimum Chip Size: 4 × 4 mm
Supported Tray: JEDEC
Inspection Time per Tray: 22 s
Inspection CT: 0.04 s
Miss Rate ≤ 0.1%
Overkill Rate ≤ 1%
FAQs
Don’t see your question answered here? Contact us today.
Apexera Station is a compact benchtop vision inspection system built for tray-loaded semiconductor chips. It automatically inspects chip orientation, surface markings, and presence, with each result mapped directly to its physical tray position.
Apexera Station automatically locates and aligns the chip before inspection, allowing normal positional and rotational variation within the tray pocket to be inspected without manual realignment.
Empty pockets are automatically identified and recorded as NG. NG results are further classified as Empty, Orientation Error, or Marking Error, with the detected rotation angle shown for orientation errors.
Yes. Operators can review the individual chip image and inspection result to see which inspection item triggered the NG decision.
Yes. Operators can select the marking content to be verified, allowing fixed and variable information to be handled according to the inspection requirement.
No. Select the existing Chip ID and its saved tray, imaging range, template, and inspection settings are loaded together, ready for inspection.
No routine manual calibration is required. The system automatically performs deviation correction to maintain alignment during inspection.
Get Started
Tell us about your chip and tray requirements. We’ll help you evaluate how Apexera Station fits your inspection workflow.